2011 |
2Chih-cheng Kao,1535 nm Emission of SiGexOyErz films,International Conference on Materials for Advanced Technologies (ICMAT 2011) |
2011 |
Chih-cheng Kao and Jen-Chieh Cheng,White Emission from SiO2 Films Co-embedded with Si and Ge Quantum Dots,International Conference on Materials for Advanced Technologies (ICMAT 2011) |
2010 |
Wei-Cheng Chiu, and Chih-Cheng Kao,Preparation of CIGS thin films by reactive RF magnetron sputtering using one single Cu/In/Ga/Se target,2010 International Conference on Optics and Photonics in Taiwan(OPT'10) |
2010 |
Jen-Chieh Cheng , Chih-Cheng Kao,Intense visible emission and super lattice structure of Six GeyO1-x-y films,2010 International Conference on Optics and Photonics in Taiwan(OPT'10) |
2010 |
Chih-cheng Kao, Wei-Jr Tzeng and Yuen-Yi Wu,1535 nm emission of SiGecOyErz films,The 9th International Symposium on Advanced Technology (ISAT 9) |
2010 |
Wei-Jr Tzeng,Chih-cheng Kao,Optimization of electro-luminescence performance of silicon quantum dots based light-emitting-diode,IEEE International NanoElectronics Conference |
2009 |
Wei-Jr Tzeng, Shou-Fu Chen, Chih-cheng Kao, |
2009 |
Chih-cheng Kao, Wei-Jr Tzeng, Hong-Shen Liou, Wei-Jung Liang, and Kang-Ren Chen,Formation and investigation of nano-particles obtained from sputtered SixGeyO1-x-y films,The 8th International Symposium on Advanced Technology |
2008 |
高至誠、李翔雲、李威達,白光奈米碳管場發射發光裝置,2008年奈米技術與材料研討會 |
2008 |
Y. J. Wang , K. R. Chen , and Chih-Cheng. Kao,Effect of substrate temperature on the microstructure of DC sputtered nanocrystalline Titanium dioxide films,2008 International Symposium on Nano Science and Technology |
2008 |
C.-C. Kao, K. R. Chen, Y. Y. Wu, and M. J. Chiang,Physical properties and effect of thermal annealing of SiOx films,The 4th International Conference on Technological Advances of Thin Films & Surface Coatings (Thin Films 2008) |
2008 |
Chih-cheng Kao, B. Gallas and J. Rivory,Annealing-induced evolutions of Er doped SiOx film,6th International Conference on Optics-photonics Design and Fabrication (ODF'08) |
2004 |
L. Siozade, I. Stenger, B. Gallas, C.C. Kao, S. Fisson, G. Vuye, J. Rivory, "Near band gap absorption of Si nanocrystals in SiO2 investigated by spectroscopic ellipsometry and photothermal deflection spectroscopy", EMRS, European Materials Research Society, 法國史特拉斯堡, 2004 年五月 |
2004 |
C.-c. Kao, L. Bigot, A.-M. Jurdyc, B. Jacquier, B. Gallas, S. Fisson, G. Vuye, J. Rivory, "Determination of effective absorption cross section of erbium in SiO2 films containing nc-Si", EMRS, European Materials Research Society, 法國史特拉斯堡, 2004 年五月 |
2003 |
B. Gallas, C.-C. Kao, S. Fission, G. Vuye, J. Rivory, "In situ control of SiOx stoechiometry by spectroscopic ellipsometry" EMRS, European Materials Research Society, 法國史特拉斯堡, 2003 年六月 |
2003 |
C.-C. Kao, C. Bartou, B. Gallas, S. Fission, G. Vuye, J. Rivory, "Photoluminescence study of SiO2 thin films doped with Si nano-grains and erbium", EMRS, European Materials Research Society, 法國史特拉斯堡, 2003 年六月 |
2003 |
B. Gallas, C.-C. Kao, C. Defranoux, S. Fission, G. Vuye, J. Rivory, "Dielectric function of Si dots embedded in SiO2", International Conference on Spectroscopic Ellipsometry, 維也納, 2003 年七月 |